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A Comprehensive TCAM Test Scheme: An Optimized Test Algorithm Considering Physical Layout and Combining Scan Test with At-Speed BIST Design

机译：一种综合的TCAM测试方案：考虑物理布局和用速度BIST设计结合扫描测试的优化测试算法

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摘要

Considering the physical layout, a comprehensive TCAM test scheme divides TCAM test into test for TCAM core and test for peripheral circuit, Besides, it schedules the existing test algorithms to develop an optimized test algorithm.

机译：考虑到物理布局，全面的TCAM测试方案将TCAM测试划分为TCAM核心的测试和外围电路的测试，除了，它将现有的测试算法调整到开发优化的测试算法。

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来源
《International Test Conference》|2009年||共10页
会议地点
作者
Hsiang-Huang Wu; Jih-Nung Lee; Ming-Cheng Chiang; Po-Wei Liu; Chi-Feng Wu;
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原文格式 PDF
正文语种
中图分类 TP274-53;
关键词
Content addressable memory (CAM); Ternary content addressable memory (TCAM); Memory testing; Mareb test algorithm; Built-in self-test (BIST);

机译：内容可寻址存储器（CAM）;三元内容可寻址内存（TCAM）;MAREB测试算法;内置自检（BIST）;

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专利

1. COMPASES: AN OPTIMIZED DESIGN FOR TESTABILITY SCHEME TO REDUCE THE COST OF TEST APPLICATION USING PARALLEL-SERIAL SCAN DESIGN [J] . JOSE M. SOLANA Journal of Circuits, Systems, and Computers . 2007,第3期

机译：组成：采用并行-串行扫描设计的可简化测试计划的设计，以降低测试应用程序的成本
2. Optimization of Test Accesses with a Combined BIST and External Test Scheme [J] . Makoto Sugihara, Hiroto Yasuura IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences . 2001,第11期

机译：结合BIST和外部测试方案来优化测试访问
3. Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping [J] . Bin Zhou, Li-Yi Xiao, Yi-Zheng Ye, Journal of Electronic Testing: Theory and Applications: Theory and Applications . 2011,第1期

机译：基于扫描切片重叠的BIST方案中的测试能力和数据量的优化
4. A comprehensive TCAM test scheme: An optimized test algorithm considering physical layout and combining scan test with at-speed BIST design [C] . Wu Hsiang-Huang, Lee Jih-Nung, Chiang Ming-Cheng, Test Conference, 2009. ITC 2009 . 2009

机译：全面的TCAM测试方案：考虑物理布局并将扫描测试与快速BIST设计结合起来的优化测试算法
5. Design for testability techniques and optimization algorithms for performance and functional testing of multichip module interconnections. [D] . Pendurkar, Rajesh Yashavant. 1999

机译：用于多芯片模块互连的性能和功能测试的可测试性技术和优化算法的设计。
6. Design and Implementation of Universal Cyber-Physical Model for Testing Logistic Control Algorithms of Production Line’s Digital Twin by Using Color Sensor [O] . Ján Vachálek, Dana Šišmišová, Pavol Vašek, 2021

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7. Optimization of test accesses with a combined BIST and external test scheme [O] . Makoto Sugihara, Hiroto Yasuura 2002

机译：使用组合BIsT和外部测试方案优化测试访问
8. Design Criteria for Wear Testing Machines. 1. Physical Mechanics: Design Criteria for Existing Wear Testing Machines. 2. Applied Mechanics: Application of Design Criteria to Existing Wear Testing Machines [R] . Vichard, J. P., Godet, M. 1981

机译：磨损试验机的设计标准。 1.物理力学：现有磨损试验机的设计标准。 2.应用力学：设计标准在现有磨损试验机上的应用

A Comprehensive TCAM Test Scheme: An Optimized Test Algorithm Considering Physical Layout and Combining Scan Test with At-Speed BIST Design

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