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Investigation on Room Temperature Vulcanized Silicon Insulation With and Without ATH Filler Loading by Incline Plane Tracking Erosion Test Method

机译:倾斜平面跟踪及侵蚀试验法研究室温硫化硅绝缘型室温硫化硅绝缘

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Insulation flashovers because of tainting are still a worldwide issue in the power System. In some dirtied areas, up to 33% of all blackout issues are credited to contamination. So strength of the power supply is a first worry in the power System. Robustness in the dielectric materials crosswise over shifting severe conditions is required. Insulator producing has changed over from porcelain and glass protectors to silicon rubber because of its light weight and high mechanical quality and better contaminant opposing execution. Be that as it may, silicon rubber has powerlessness to following and disintegration because of dry band arcing, alongside the qualities like maturing and long haul conduct is obscure. These are the reasons, for which, substitution of the current structure of porcelain coatings in the power System by silicon rubber is troublesome. In this way, Room Temperature Vulcanized (RTV) Silicon coatings is utilized as a part of strong protecting material tending to solutions for these issues. Additionally, resistive properties of RTV covering against contaminant streak over rely on substance structure and filler material. In this way, the present review explores the encasing execution amid following, disintegration and leakage current reviews on RTV Silicon with and without filler stacking examples according to IEC 60587 measures for consistent following voltage. This standard portrays the development of electrical protecting materials utilized under extreme surrounding conditions at power frequencies by estimation of the imperviousness to following and disintegration, utilizing a fluid contaminant and inclined plane examples. For the leakage current estimation, Pico scope interface and a protective circuit were made over the shunt. The leakage current example has been examined with connected voltage for the RTV with and without ATH (Aluminum Tri Hydroxide) filler stacking silicon rubber material. Compound investigation on RTV tests like FTIR, thermal study TGA and morphological study by SEM-EDXA; have been done before and in the wake of following and disintegration test. Comes about and conclusion demonstrates that RTV tests with ATH filler stacking are all the more electrically resistive amid following and disintegration and displays fantastic properties contrasted with RTV tests without ATH filler stacking.
机译:绝缘闪光件由于污染而仍然是电力系统的全球问题。在一些脏污区域,占污染的最多33%的污染问题。因此,电源的强度是电力系统的首次担忧。需要在介电材料中横向旋转严重条件的鲁棒性。由于其轻质和高机械质量和更好的污染物相反的执行,绝缘体生产已经从瓷器和玻璃保护剂到硅橡胶变为硅橡胶。尽管如此,硅橡胶由于干频弧线而无能为力,崩溃,以及更好的品质和长途行为的质量是模糊的。这些是原因,由此,通过硅橡胶替换电力系统中的瓷涂层的当前结构是麻烦的。以这种方式,室温硫化(RTV)硅涂层用作趋向于这些问题的溶液的强保护材料的一部分。另外,RTV覆盖依赖于物质结构和填料的污染物条纹的电阻性。通过这种方式,目前的审查探讨了在RTV硅的泄漏和泄漏当前评论中探讨了rtv硅的泄漏当前评论,并且没有根据IEC 60587措施的填充堆叠示例,以符合以下的电压。该标准描绘了在功率频率的极端周围条件下使用的电保护材料的开发,利用流体污染物和倾斜平面示例估计不透视和崩解。对于漏电流估计,在分流器上进行微微范围界面和保护电路。泄漏电流示例已被检查,具有rTV的连接电压,无且没有Ath(Tri氢氧化铝)填料堆叠硅橡胶材料。 SEM-Edxa等FTIR,热学研究TGA和形态学研究等RTV试验的复合研究;在跟踪和崩解测试之前和之后已经完成。出现并结论表明,具有Ath填充物堆叠的RTV测试是含有追踪和崩解的所有电阻,并显示出与RTV测试形成对比的梦幻般的性质,而无需Ath填充物堆叠。

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