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Work-in-Progress: Lightweight Deadlock Detection Technique for Embedded Systems via OS-Level Analysis

机译:经营进展:通过OS级分析的嵌入式系统的轻量级死锁检测技术

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In this paper, we propose a dynamic analysis technique that diagnoses various kinds of deadlocks of embedded devices by OS-level analysis. Especially, we focus on minimizing performance overhead while inspecting deadlocks, because embedded applications run with limited system resources. Our experimental results show that our scheme detects all deadlocks which are induced in our test cases and incurs reasonable performance overhead (up to 16%), compared with the conventional scheme.
机译:在本文中,我们提出了一种动态分析技术,通过OS级分析诊断嵌入式设备的各种死锁。特别是,我们专注于在检查死锁时最小化性能开销,因为嵌入式应用程序运行有限的系统资源。我们的实验结果表明,与传统方案相比,我们的计划检测到我们的测试用例中诱导的所有死锁,并涉及合理的性能超过(高达16%)。

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