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Optical systems for laser-produced plasma EUV and soft X-ray sources

机译:激光产生的等离子体EUV和软X射线源的光学系统

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Laser-produced plasmas (LPP) are efficient sources of soft X-ray (SXR) and extreme ultraviolet (EUV) radiation. The emitted radiation can be collected and focused using grazing incidence or multilayer mirrors. This way radiation beams of high fluence can be formed. Their interaction with gases results in formation of photoionized plasmas of different parameters, depending on the fluence and properties of the gas. In this work LPP SXR and EUV sources, based on nanosecond Nd:YAG lasers and a double stream gas puff target are described. Parameters of the radiation pulses focused using the corresponding collectors, were measured. The sources were used for creation of the EUV induced, low-temperature plasmas. For measurements of the weak EUV emission signals from these plasmas, a special detection system, containing a paraboloidal collector, was prepared. Time integrated, EUV intensity distribution in a focal spot of the collector, was measured using a back-illuminated CCD detector. Temporal measurements of the EUV signals were performed employing an AXUV photodiode mounted in the focal plane.
机译:激光产生的等离子体(LPP)是软X射线(SXR)和极端紫外(EUV)辐射的有效源。可以使用放牧发射或多层镜收集并聚焦发出的辐射。这种方式可以形成高流量的辐射束。它们与气体的相互作用导致相应的不同参数的光相差异,这取决于气体的流量和性质。在这项工作中,基于纳秒Nd:YAG激光器和双流气体粉扑目标,LPP SXR和EUV源。测量使用相应的收集器聚焦的辐射脉冲的参数。该来源用于创建EUV诱导的低温等离子体。为了测量来自这些等离子体的弱EUV发射信号,制备了一种含有抛物线收集器的特殊检测系统。使用背光发光的CCD检测器测量收集器的焦点中的时间集成,EUV强度分布。通过安装在焦平面中的AXUV光电二极管进行EUV信号的时间测量。

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