首页> 外文会议>Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics >Linearized and Compensated Interferometric System for High-Velocity Traceable Length Calibration on a Metre Scale
【24h】

Linearized and Compensated Interferometric System for High-Velocity Traceable Length Calibration on a Metre Scale

机译:用于仪表级的高速可追踪长度校准的线性化和补偿干涉系统

获取原文

摘要

We report on a traceable calibration system for a 3500mm-long console that carries a measurement system for inspecting the diameter of a circular reactor chassis. The system uses two single-pass laser interferometers with homodyne fringe detection for measurement in two degrees of freedom. The hybrid FPGA-microcontroller control module carries out the fringe detection together with the application-specific scale linearization approach and the compensation of environmental influences such as thermal elongation and the refractive index of air fluctuations. We demonstrated the system feasibility with an accuracy of a few microns and translation velocity higher than 0.1 metre per second.
机译:我们报告了一个可追踪校准系统,用于3500mm长控制台,该系统承载测量系统,用于检查圆形反应器底盘的直径。该系统使用两个单通激光干涉仪,其中具有同源的边缘检测,以便在两度自由度中测量。混合式FPGA微控制器控制模块与应用专用的刻度线性化方法一起进行条纹检测,并补偿环境影响,例如热伸长率和空气波动的折射率。我们证明了系统可行性,精度为几微米,翻译速度高于每秒0.1米。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号