A 28nm fully digital voltage monitor with 16.5uV/°C accuracy and 0.8mV quantized error from -40 to 160°C for ISO26262 ASIL-D capable MCU

摘要

A fully digital voltage monitoring system has been developed for automotive ISO26262 ASIL-D capable MCUs to detect internal under-voltage fault at IR-drop hotspots and to mitigate large Vmin margin due to voltage detection variation. Proposed oscillators employing temperature coefficient tuners enable digitized voltage detection with small temperature drift and quantized error. A digital voltage monitor fabricated in 28nm shows temperature drift of 16. SuV/°C and 0.8mV quantized error. The total voltage detection variation of 4.1mV is the smallest and the temperature range from -40 to 160°C is the largest compared with previous works