Climate and Mounting Specific Testing of Bypass Diodes / Junction Boxes for Improving Long Term Reliability and Cost Reduction

摘要

It is well known that PV modules experience significantly different stressors in field depending on the climate and mounting of deployment. Therefore, the climate specific rating and associated tests for modules are being developed. However, currently there are no climate-specific tests for bypass diodes. It is shown by modeling and experimental results that the differences in the stressors experienced by bypass diodes in PV modules according to climate and mounting are significant. The benefits of designing bypass diode / junction box systems according to end use environment in terms of improved reliability and cost reduction are explained with the illustrative study of test development for High Temperature Forward Bias (HTFB) operation. Climate / mounting specific HTFB tests are developed for bypass diodes for three target climates (Hot-dry: Phoenix, Hot-humid: Miami, Temperate: Denver) and two mounting configurations (Rack mount and Roof mount).