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Susceptibility of DC breakdown in dielectric-loaded systems

机译:电介质系统中DC击穿的易感性

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This work presents a novel theory of breakdown susceptibility for dielectric-loaded systems in DC, targeting multipactor as the lowest-order effect. Models from [1] are simulated with 2D particle-in-cell (PIC) using the method of [2], and susceptibility limits are developed employing the theory of [3]. Considering secondary electrons near the dielectric surface have a lifetime defined by the perpendicular (to the surface) electric field and an impact energy defined by the parallel field, a lower limit, (E/E)1, and an upper limit, (E/E)2, in E/E-space can be formulated for multipactor in vacuum under quasi-static conditions neglecting space charge:
机译:这项工作提出了一种新颖的DC中介电加载系统的分解敏感性理论,靶向多移能势作为最低阶效应。使用[2]的方法,用2D粒子 - 细胞(PIC)模拟来自[1]的模型,采用[3]理论,开发了易感限制。考虑到介电表面附近的二次电子具有由垂直(到表面)电场限定的寿命和由并联场限定的冲击能量,下限(例如,E / E ) ‖ 1 ,上限(E / E )2,在E ⊥< / INF> / E - 空间可以在忽略空间充电的准静态条件下真空配制多移液器:

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