Susceptibility of DC breakdown in dielectric-loaded systems

摘要

This work presents a novel theory of breakdown susceptibility for dielectric-loaded systems in DC, targeting multipactor as the lowest-order effect. Models from [1] are simulated with 2D particle-in-cell (PIC) using the method of [2], and susceptibility limits are developed employing the theory of [3]. Considering secondary electrons near the dielectric surface have a lifetime defined by the perpendicular (to the surface) electric field and an impact energy defined by the parallel field, a lower limit, (E