Pulse initiated systems are designed to reliably and consistently operate when energized above a threshold value. The situation exists where these systems can be exposed to pulsed and transient signals that are directly injected due to external coupling factors that do not initiate the system. This paper will examine the potential for transient currents to cause unforeseen stress to theses electrical devices and systems, which can lead to aging, malfunction and possibly failure. This work will address the process of quantifying the detrimental effects, in order to understand non-ideal performance or the mechanics of failure due to pulsed and other transient currents that are less than what is required to initiate. A test and data acquisition circuit is designed and built that enables a constant current source to pulse the device under test. The data collected will be compared to the theoretical results of a finite element multi-physics simulation. Upon completion, any changes in resistive properties will be evaluated to determine if there were quantifiable effects that have contributed to the aging process.
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