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High-resistance W-plug Monitoring with an Advance e-beam Inspection System

机译:具有先进电子束检测系统的高电阻W型插头监控

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Dark voltage contrast (DVC) defects are detected on normally bright tungsten plugs (W-plugs) during the in-line e-beam inspection step. Cross-sectional scanning electron microscope (SEM) and transmission electron microscope (TEM) in a failure analysis (FA) lab verified that DVC defects with different gray level values (GLV) are caused by different resistances of the W-plugs. We found that DVC defects with lower GLV (GLV1) are W-plugs that are open or almost open. DVC defects with higher GLV GLV2 are caused by partially open W-plugs and in-plug voids. Wafer acceptance test (WAT) results correlated well with e-beam inspection results.
机译:在线电子束检查步骤期间,在正常明亮的钨塞(W-PLACK)上检测暗压对比度(DVC)缺陷。在故障分析(FA)实验室中的横截面扫描电子显微镜(SEM)和透射电子显微镜(TEM)验证了具有不同灰度值(GLV)的DVC缺陷是由W-Plums的不同电阻引起的。我们发现具有较低GLV(GLV1)的DVC缺陷是打开或几乎打开的W-PLAN。具有较高GLV GLV2的DVC缺陷是由部分打开的W-PLATE和插入式空隙引起的。晶圆验收测试(WAT)结果与电子束检验结果相关。

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