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Analysis of Measuring Errors of Micro-Deformation Using Speckle Digital Image Correlation

机译:散斑数字图像相关性测量微观变形的测量误差

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Speckle digital image correlation (DIC) method has extended its application to micro-deformation measurement in nanoscale except for in microscale and macroscale. Because of its micro-deformation errors mainly depend upon the correct selection of the parameters of DIC method and its hardware setup, key parameters and how these parameters influence the measuring accuracy should be clarified in detail. So the micro-deformation measuring errors using DIC method are evaluated in different conditions of the parameters in deformation simulation experiments and the practical tensile test experiments, considering the difficulties of micro-deformation measuring experiment setup in nanoscale, and Some suggestions has been presented.
机译:除了在Microscale和Macroscale中,散斑数字图像相关(DIC)方法将其应用于纳米尺度的微变形测量。 由于其微变形误差主要取决于DIC方法的正确选择及其硬件设置,关键参数以及这些参数如何影响测量精度。 因此,考虑到纳米级微变形测量实验设置的难点,在变形模拟实验中的参数的不同条件下评估使用DIC方法的微变形测量误差,并提出了一些建议。

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