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Analysis of measuring errors of micro-deformation using speckle digital image correlation

机译:利用散斑数字图像相关技术分析微变形的测量误差

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Speckle digital image correlation (DIC) method has extended its application to micro-deformation measurement in nanoscale except for in microscale and macroscale. Because of its micro-deformation errors mainly depend upon the correct selection of the parameters of DIC method and its hardware setup, key parameters and how these parameters influence the measuring accuracy should be clarified in detail. So the microdeformation measuring errors using DIC method are evaluated in different conditions of the parameters in deformation simulation experiments and the practical tensile test experiments, considering the difficulties of micro-deformation measuring experiment setup in nanoscale, and Some suggestions has been presented.
机译:除微尺度和宏观尺度外,散斑数字图像相关(DIC)方法已将其应用扩展到了纳米尺度的微形变测量中。由于其微变形误差主要取决于正确选择DIC方法的参数及其硬件设置,因此应详细说明关键参数以及这些参数如何影响测量精度。因此,考虑到纳米级微形变测量实验装置的难点,在变形模拟实验和实际拉伸试验实验中,在不同参数条件下,采用DIC法对微形变测量误差进行了评估,并提出了一些建议。

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