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Improvement of Ambient Contrast of Micro-LED Devices with High Reliability

机译：具有高可靠性微LED器件的环境对比度的改进

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《International Conference on Display Technology;Society for Information Display 》||1-5|共5页
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Ke Zhang; Siwu Yan; Yibo Liu; Tingting Han; Wai Keung Cho; Zhaojun Liu; Hoi-Sing Kwok;
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1. Improvement of Ambient Contrast of Micro-LED Devices with High Reliability [J] . Ke Zhang, Siwu Yan, Tingting Han, SID International Symposium: Digest of Technology Papers . 2019 ,第1期

机译：具有高可靠性微LED器件的环境对比度的改进
2. Effect of character contrast ratio of tablet PC and ambient device luminance ratio on readability in low ambient illuminance [J] . Hanui Yu, Takeshi Akita, Takaaki Koga, Displays . 2018 ,第APRa期

机译：平板电脑的字符对比度和周围设备亮度比率对低环境照度下的可读性的影响
3. Contrast improvement of organic light-emitting devices with Sm:Ag cathode [J] . K. C. Lau, W. F. Xie, H. Y. Sun, Applied Physics Letters . 2006 ,第8期

机译：与Sm：Ag阴极的有机发光器件的对比改进
4. Improvement of Ambient Contrast of Micro-LED Devices with High Reliability [C] . Ke Zhang, Siwu Yan, Yibo Liu, International Conference on Display Technology;Society for Information Display . -1

机译：具有高可靠性微LED器件的环境对比度的改进
5. Oxide reliability improvement through nitridation technology in VLSI CMOS and nonvolatile memory devices. [D] . Zhou, Zhixu. 1999

机译：通过VLSI CMOS和非易失性存储器件中的氮化技术提高了氧化物的可靠性。
6. Investigation of Electrical Properties and Reliability of GaN-Based Micro-LEDs [O] . Ke Zhang, Yibo Liu, Hoi-sing Kwok, 2020

机译：GaN基微型LED的电学性能和可靠性研究
7. Investigations of Material Properties of Underfill Material for Mechanical Reliability Improvement of Electronic Devices [O] . Byung-Seung Yim, Jin-Nam Kim, Jong-Min Kim 2019

机译：电子设备机械可靠性改进底填充材料材料特性的研究

Improvement of Ambient Contrast of Micro-LED Devices with High Reliability

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