Advancements in semiconductor technology coincide with an increasing need for better understanding of thermal transport and phonon behaviour in such devices. The difficulty lies with observing and measuring these phonon properties, oftentimes proving to be a challenge due to the limitations posed by instrumental capabilities. Yokogawa et al obtained inelastic X-ray scattering results for SiGe alloys, and found an unidentified phonon mode (～ 50- 150 cm~(-1)) within the phonon spectra. Determining the possible conditions for producing this unknown mode drove the motivation for this current study and thus, forms the theme for this project.
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