Scanning Electrochemical Cell Microscopy; Measurement Process Optimization to the Electrochemical Response Based on Experimental Parameters

摘要

As the development of scanning probe microscopy (SPM) continues, the spatial resolution and sensitivity for various material properties steadily improve. Therefore, SPM images morphological features as well as electrical, mechanical, magnetic, and chemical properties with a nanoscale resolution. Among the various SPM techniques, pipette-based SPM offers new possibilities and insights into the sample's electrochemical properties. Since the invention of scanning electrochemical microscopy (SECM), the first-generation pipette-based SPM for electrochemical measurement, it has been extensively used in many research fields, e.g. for visualizing chemical reactions at surfaces and interfaces. However, the difficult distance control between the pipette probe and the sample surface limits the application of SECM.