Design and Development of a Compact Fiber Optic Phase Shifting ESPI System for Engineering Metrology

摘要

Electronic Speckle Pattern Interferometry (ESPI) has wide range of applications in Enginerring Metrology such as measurement of deformation, displacement components and their derivatives, shape measurement and Non-Destructive Testing (NDT) of an object. The technique uses electonic detection and iamge processing. Teh speckled image data of unloaded and loaded states of the object are processed and the results, in fomer of fringe pattenrs, are displayed in real-time on a TV monitor. In this paper, we present the design and developmental details of an ESPI system using standard single mode optical fibers. The developed system is used in different configurations for variosu applications like displacement and slope measurement and NDT of materials.