Investigation of sensitive depth on a 32-bit microprocessor by laser test

摘要

In this paper, the sensitive characteristics of the microprocessor based on Scalable Processor ARChitecture Version 8 (SPARC V8) architecture are studied by laser equipment which can simulate the single event effect (SEE) of device. Utilizing the adjustability of laser focal panel, we obtain the sensitive depth of devices which are fabricated in 180nm technology. Results show that the sensitive depth of the different sensitive areas is almost the same whose value is about 1μm. Therefore, we can draw a conclusion that the devices of the same technology have a certain sensitive depth. It offers essential information to the radiation hardened work in the future.