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Molecular Dynamics Simulation of Pyrolysis and Electric-caused Disintegration Mechanism of Polyphenylene Sulfide

机译:聚苯硫醚热解和电阻崩解机理的分子动力学模拟

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Polyphenylene Sulfide (PPS) has good thermal stability and electrical properties, and is often used in the insulation of electrical equipment such as transformers. Taking PPS as the research object, this paper adopts reactive molecular dynamics simulation based on reactive force field (ReaxFF) to study pyrolysis and electric-caused disintegration mechanisms of PPS at the microscopic level. The results indicate that thioether bond (C-S bond) and delocalized π bond (C-C bond) are respectively the first to break under high temperature and high electric field intensity. The cleavage of chemical bonds leads to the decrease of polymerization degree, which is the main cause for PPS insulation aging. The products of PPS molecules under high temperature and electric field are basically similar, including C2H2, H2S and etc. These gas products will accumulate inside the PPS and generate micropores, which may result in partial discharge and further damage to the insulation of PPS. We found the electric field stresses and deforms PPS molecules by weakening the van der Waals force of the polymer system. The decrease of degree of polymerization (DP) rapidly deteriorates the resistance of PPS chains to high electric field intensity, which leads to structural damage and further insulation damage of PPS material.
机译:聚苯硫醚(PPS)具有良好的热稳定性和电性能,并且通常用于电气设备的绝缘器,例如变压器。采用PPS作为研究对象,本文采用基于反应力场(REAXFF)的反应分子动力学模拟,以研究微观水平的PPS热解和电阻崩解机制。结果表明硫醚键(C-S键)和分层π键(C-C键)分别是在高温和高电场强度下突破。化学键的切割导致聚合度降低,这是PPS绝缘老化的主要原因。高温和电场下PPS分子的产品基本相似,包括C. 2 H 2 , H 2 S等等。这些气体产品将积聚在PPS内并产生微孔,这可能导致部分放电和对PPS绝缘的进一步损坏。我们发现电场应力并通过削弱聚合物体系的范德华力而变形PPS分子。聚合程度(DP)的降低迅速降低了PPS链对高电场强度的电阻,这导致PPS材料的结构损坏和进一步的绝缘损坏。

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