Visualization of defects on a cultured cell layer by utilizing chemical imaging sensor

摘要

The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) in the sample. In this study, a novel wound-healing assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the defect of a cell layer brought into proximity of the sensing surface. A reduced impedance inside the defect, which was artificially formed in a cell layer, was successfully visualized in a photocurrent image.