Crystallographic Analysis of the Implanted TiNi Monocrystal Containing Misoriented Localized Shear Mesobands in its Near-Surface Layer 001_B2

摘要

The study was carried on for the implanted single TiNi crystal containing misoriented localized shear mesobands in its near-surface layer [001] B2. Due to the response of material to the Si ion implantation treatment of the single TiNi crystal, deformation mesobands would form in its near-surface layer. Specially designed software tools were employed for the treatment of experimental data obtained from X-ray and electron diffraction patterns. The 3D crystallographic orientations were calculated for the localized shear regions, which were displaced relative to one another and with respect to the original monocrystal orientation.