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High Resolution X-ray Photoelectron Spectroscopy Study of the Interaction of Copper Ion with Chitosan Thin Film

机译:高分辨率X射线光电子能谱研究铜离子与壳聚糖薄膜的相互作用研究

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In this study, high-resolution X-ray photoelectron spectroscopy (XPS) has been used to study the chemical interaction between copper ion and chitosan thin film. The chitosan solution was synthesized by homogeneous reaction of medium molecular weight chitosan in aqueous acetic acid with glutaraldehyde as crosslinking agent. Then the solution was deposited on glass cover slip by spin coater to form a thin film. The functional group and chemical binding of crosslinked chitosan thin film has been confirmed by XPS. XPS revealed that copper ion adsorbed to the crosslinked chitosan thin film and the functional groups involved in the adsorption mechanisms of copper ion on the thin film were determined.
机译:在该研究中,高分辨率X射线光电子能谱(XPS)已经用于研究铜离子和壳聚糖薄膜之间的化学相互作用。通过用戊二醛作为交联剂,通过培养基分子量壳聚糖含量的含水乙酸水溶液的均匀反应合成壳聚糖溶液。然后通过旋转涂布机沉积溶液以形成薄膜。交联壳聚糖薄膜的官能团和化学结合已通过XPS证实。确定XPS显示吸附到交联的壳聚糖薄膜和掺入薄膜上铜离子吸附机制的官能团的铜离子。

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