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Parameters of Heavy-Ion Elastic Recoil Detection Analysis (HI ERDA) ToF Telescope

机译:重离子弹性反冲检测分析参数(HI ERDA)TOF望远镜

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In material research, the need to determine the composition of thin layers in the range of thickness from nm to few microns often arises. If light elements have to be measured in a material containing heavy elements, the Time of Flight Elastic Recoil Detection Analysis (ToF ERDA) is the optimal choice. The ToF ERDA provides the quantitative depth profiles of elements in the sample. The parameters of the ToF ERDA telescope for STU ion beam laboratory in Tmava were proposed based on the application requirements and on the results and experience from ToF ERDA telescopes already implemented in other ion beam laboratories, especially in recent years. The depth of analysis in the range of several microns was tested using conventional ERDA measurements.
机译:在材料研究中,需要在NM到几微米的厚度范围内确定薄层的组成通常产生。如果必须在包含重点的材料中测量光元件,则飞行时间弹性反冲检测分析(TOF ERDA)是最佳选择。 TOF ERDA提供样品中元素的定量深度谱。基于应用要求,提出了TMAVA的STO离子梁实验室的TOF ERDA望远镜参数,并根据其他离子束实验室在其他离子束实验室中实施的TOF ERDA望远镜的结果和经验,特别是近年来。使用常规ERDA测量测试几微米范围内的分析深度。

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