Spectroscopic Ellipsometry of P3HT Layers Prepared by Spin Coating

摘要

P3HT belongs to the most progressive substance used in photovoltaics as a promising material exhibiting interesting and useful physical properties. We applied the New amorphous material model derived by Horiba for optical characterization of P3HT layers prepared by spin coating deposition. As the first step, the thickness of the fabricated films in the range 20-250 nm were measured using three different methods - spectroscopic ellipsometry, spectroscopic optical reflectometry and profilometry. We demonstrated the validity of the chosen New amorphous material model in the spectral range 550-850 nm.