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In-situ probing reactivity at buried interfaces: limits and challenges of iocai electrochemical impedance mapping and time lapse microscopy

机译:原位探测埋地界面的反应性:IOCAI电化学阻抗映射和时间流逝显微镜的限制与挑战

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The degradation of polymer coated metais is a combination of complex mechanisms involving local processes at buried interfaces.Classical monitoring of the degradation of such a system by electrochemical impedance spectroscopy does not allow to localize the phenomena while more detailed post-mortem morphological and chemical analysis does not provide real time information about the evolution of the interfaces.This explains the increasing interest to localized in-situ reactivity measurements.While Scanning Kelvin Probe(SKP)is used to monitor delamination of the polymer during exposure in humid air [1],Local Electrochemical Impedance Spectroscopy and Mapping(LEIS and LEIM)seems to be the most attractive tool to monitor the anodic reactivity at metal/polymer interface in immersion conditions and can be conducted in a quantitative way [2,3].LEIM seems however be less adopted for cathodic reactivity measurement because of diffusion and not charge transfer limited rate of cathodic oxygen or water reduction.However,the fact that cathodic reactivity generates hydroxide ions and/or gas formation offers a possibility to survey it using Time Lapse Microscopy(TLM).
机译:聚合物涂覆的Metais的降解是涉及掩埋界面的局部过程的复杂机制的组合。通过电化学阻抗光谱对这种系统的降解的性质监测不允许本地化现象,同时更详细地验尸形态和化学分析不提供有关界面演变的实时信息。这解释了对局部原位反应性测量的日益兴趣。扫描kelvin探针(SKP)用于监测潮湿空气暴露过程中聚合物的分层[1],局部电化学阻抗光谱和测绘(leim)似乎是最有吸引力的工具,用于监测浸入条件下的金属/聚合物界面处的阳极反应性,并且可以以定量的方式进行[2,3] .Lleim似乎较少对于阴极反应性测量,由于扩散而不是电荷转移限制的阴极氧或W亚特reduction.However,即阴极反应产生氢氧根离子和/或气体形成报价的可能性使用时间间隔显微镜(TLM)调查它的事实。

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