首页> 外文会议>Advances in Soft Materials >Study of Lead Nitrate Doped PVA/PVP Blend Films using EDXRF and Complementary Techniques
【24h】

Study of Lead Nitrate Doped PVA/PVP Blend Films using EDXRF and Complementary Techniques

机译:使用EDXRF和互补技术研究铅硝酸铅掺杂PVA / PVP共混膜

获取原文

摘要

Polyvinyl alcohol (PVA) - polyvinyl pyrrolidone (PVP) blend solutions were doped with different amounts of lead nitrate (Pb(NO3)2), in the doping range varying from 2.7 wt% up to 50.5 wt%. In this paper, the study of these films using Energy Dispersive X-ray Fluorescence (EDXRF) technique in 2 π geometrical configuration is explained. In order to study K shell (K_(αβ)) X-rays from the prepared films, cobalt-57 radio-isotope and thallium doped sodium iodide [NaI(Tl)] scintillation gamma/ x-ray detector system with 1k MCA are used. The experiment was complemented by Scanning Electron Microscopy (SEM) coupled with Energy Dispersive X-ray Spectroscopy (EDS). The SEM images revealed that the filler (Pb(NO3)2) causes significant micro-structural changes in doped PVA/PVP blend films, revealing phase separation of the material into a polymer rich region and a dopant rich region at doping levels beyond 12.1 wt%. In addition to SEM, the EDXRF study is complemented by X-Ray Diffraction (XRD) and Differential Scanning Calorimetry (DSC) scans on the Pb (NO3)2 doped PVA/PVP blend films.
机译:聚乙烯醇(PVA) - 聚乙烯吡咯烷酮(PVP)共混物溶液掺杂有不同量的硝酸铅(PB(NO 3)2),在掺杂范围内,从2.7wt%相同,高达50.5wt%。在本文中,解释了使用2π几何构型中使用能量分散X射线荧光(EDXRF)技术的这些薄膜的研究。为了研究来自制备的薄膜的k壳(K_(αβ))X射线,使用钴-57无线电同位素和掺杂掺杂碘化钠[Nai(T1)]闪烁γ/ X射线探测器系统,其中具有1K MCA的闪烁γ/ X射线探测器系统。通过扫描电子显微镜(SEM)与能量分散X射线光谱(EDS)互补的实验。 SEM图像显示填料(PB(NO 3)2)导致掺杂的PVA / PVP共混膜中的显着微结构变化,将材料的相分离透露到聚合物中富有的聚合物和掺杂剂富含掺杂水平超过12.1wt的掺杂水平的掺杂物%。除SEM外,EDXRF研究还通过X射线衍射(XRD)和差示扫描量热法(DSC)扫描(NO 3)2掺杂PVA / PVP共混膜互补。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号