The coherent phonons are detected through the oscillation of transient reflection or transmission of the probe pulse as a function of the delay τ after the pump pulse[1]. Usually, only the integrated intensity of the reflected or transmitted probe pulse is measured. Recently, Mizoguchi et al. [2] performed systematic measurements of the frequency-resolved reflection spectra for CdTe crystal. In their experiment, the reflection change induced by the coherent phonon generated by a femto second pulse was measured as a function of the delay τ, the central frequency Ω1 of the probe pulse, and the detection frequency Ω2 as ΔR(τ, Ω1, Ω2)/R0 (R0 is the unperturbed reflection). This revealed Ω1 dependent peculiar behaviors.
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机译：通过振荡脉冲的瞬态反射或传输作为泵脉冲之后的延迟τ的函数来检测相干声子。通常，仅测量反射或透射探针脉冲的集成强度。最近，Mizoguchi等人。 [2]对CDTE晶体进行频率分辨的反射光谱进行系统测量。在实验中，由毫微微第二脉冲产生的相干声子引起的反射变化作为延迟τ，探针脉冲的中央频率ω1的函数，以及检测频率ω2为Δr（τ，ω1，ω2 ）/ R 0 （R 0 是不受干扰的反射）。这揭示了ω1依赖性特殊行为。
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