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Study on the Influence of Process Parameters on the Distribution of Macro-particles on the Surface of Films

机译:过程参数对薄膜表面宏观粒子分布的影响研究

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This paper systematically studies the distribution of macro-particles on the surface of film influenced by the substrate position under conditions of the same magnetic field, different pulsed bias voltage and reaction gas partial pressure, and analyzes the mechanism of macro-particles influenced by different parameters. This study indicates that the substrate position has a better effect on decreasing macro-particles than that of the pulsed bias voltage and particles in different substrate position are very different in their forms and appearances, which easily leads to uneven deposition; under the same bias, the number of particles firstly increases and then decreases with the increasing the distance from substrate position to the center, and the number of particles with over 2μm diameter largely decreases with the increasing the distance from substrate position to the center, so surface morphologies of films are improving; under the lower intensity of magnetic field, the distribution of macro-particles has a great change with the increasing the distance from substrate position to the center, and under the higher intensity of magnetic field, the substrate position has little influence on the distribution of macro-particles on the surface of film. Under the higher intensity (30G) of magnetic field, the distribution of macro-particles on the surface of film has minor change whatever reaction gas partial pressure and substrate position increase, and most particles are small in sizes and are solid spherical in shape. The higher intensity (30G) of magnetic field enhances the uniformity of film deposition and decreases the dependency of macro-particles distribution on other parameters.
机译:本文系统地研究了在相同磁场的条件下,不同脉冲偏置电压和反应气体压力下受基板位置影响的薄膜表面上的宏观颗粒的分布,分析了受不同参数影响的宏观粒子的机制。该研究表明,基板位置对降低宏颗粒具有更好的效果,而不是脉冲偏置电压和不同基板位置的颗粒的形式和外观非常不同,这容易导致不均匀的沉积;在相同的偏压下,颗粒的数量首先增加,然后随着从底板位置到中心的距离增加,并且具有超过2μm的颗粒的数量在很大程度上随着从基板位置到中心的距离而大大降低,因此薄膜的表面形态正在改善;在磁场的较低强度下,宏观粒子的分布具有随着从基板位置到中心的距离而增加的巨大变化,并且在磁场的较高强度下,基板位置对宏的分布几乎没有影响 - 薄膜表面的颗粒。在较高强度(30g)的磁场下,薄膜表面上的宏观颗粒的分布在任何反应气体压力和基板位置增加的任何反应气体部分压力和基板位置增加,并且大多数尺寸都小,并且是固体球形的尺寸。较高强度(30g)的磁场增强了膜沉积的均匀性,并降低了宏观微粒分布对其他参数的依赖性。

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