Dielectric and Impedance Spectroscopic studies of SrBi_(4-x)La_xTi_4O_(15)

摘要

Ceramic samples of SrBi_(4-x)La_xTi_4O_(15) with x=0.025 is prepared by standard solid state reaction method. The phase formation is confirmed by X-ray diffraction (XRD) studies. The Dielectric and Impedance measurement has been performed in the temperature range 50°C to 600°C and the frequency range 1Hz to 1MHz. The Curie temperature is found to decrease from 535°C to 505°C. The Cole-Cole plots are semi circles in the temperature range 450°C to 600°C. The relaxation time is decreased with increase of temperature. The investigations on this material at high temperatures and frequencies reveal its stable behavior.