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Electrical Properties of ZnO Thin Films Prepared by Sol-gel Technique

机译:溶胶 - 凝胶技术制备的ZnO薄膜的电性能

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Zinc Oxide (ZnO) thin films were deposited on a glass substrate by sol-gel process dip-coating method. Zinc acetate dehydrate Zn(O_2 CCH_3)_2(H_2O_)2 are used as a starting material while 2-methoxyethanol (C_3H_8O_2) and monoethanolamine (MEA) are us ed as a solvent and stabilizer. The molar ratio of zinc acetate dihydrate to MEA is 1:1. The molarity of the solution and pre-heating temperature were kept constant at 0.4M and 150°C. Annealing temperature was fixed at 550°C but the withdrawal speed was varied from lmm/s to 9mm/s. The effects of withdrawal speed on electrical and surface morphology of the ZnO thin films have been investigated. The electrical and surface morphology properties of the ZnO thin films were characterized by I-V measurement and atomic force microscopy (AFM). The electrical measurement showed that current decrease when the withdrawal speed increases. High conductivity at 5.87×10 S/cm and lowest resistivity about 1.7×10~3 ft/cm have been obtained for lmm/s withdrawal speed. AFM micrographs showed average grain size of ZnO thin films increases from 120.862nm to 138.521nm with an increasing in withdrawal speed.
机译:通过溶胶 - 凝胶工艺浸涂法在玻璃基板上沉积氧化锌(ZnO)薄膜。乙酸锌脱水Zn(O_2 CCH_3)_2(H_2O_)2用作原料,而2-甲氧基乙醇(C_3H_8O_2)和单乙醇胺(MEA)是溶剂和稳定剂。醋酸锌二水合物与MEA的摩尔比为1:1。溶液和预热温度的摩尔度保持在0.4m和150℃的恒定。退火温度在550℃下固定,但取出速度从LMM / s变化至9mm / s。研究了取消速度对ZnO薄膜的电气和表面形态的影响。通过I-V测量和原子力显微镜(AFM)的特征在于ZnO薄膜的电气和表面形态特性。电测量表明,当抽出速度增加时电流降低。在5.87×10 s / cm处的高电导率和约1.7×10〜3ft / cm的最低电阻率为LMM / S取液速度。 AFM显微照片显示ZnO薄膜的平均晶粒尺寸从120.862nm增加到138.521nm,随着戒断速度而增加。

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