Estimation of Storage Life of Electronic Components Based on Degradation Analysis

机译：基于劣化分析的电子元件储存寿命估算

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摘要

This article presents one of the ways to use built-in self-test. A method for estimating of storage life of integrated circuits based on predicting the degradation of parameters measured during self-test is proposed.

机译：本文介绍了一种使用内置自检的方法之一。提出了一种基于预测自测测量的参数劣化的集成电路储存寿命的方法。

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来源
《IEEE East-West Design amp;amp;amp; Test Symposium》|2018年|929p|共4页
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作者
A. Ya. Koulibaba; A. Yu. Shtukarev; A.A. Sashoy; O.V. Yushin;
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原文格式 PDF
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中图分类 TP3-53;
关键词
built-in self test; integrated circuit reliability; integrated circuit testing;

机译：内置自检;集成电路可靠性;集成电路测试;

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Estimation of Storage Life of Electronic Components Based on Degradation Analysis

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