首页> 外文会议>International Symposium on Test Automation Instrumentation >A Few Improvement for Low-frequency Impedance Analysis
【24h】

A Few Improvement for Low-frequency Impedance Analysis

机译:低频阻抗分析的一些改进

获取原文

摘要

Two improvements for traditional low-frequency impedance analysis technology were studied. Firstly, the dual-DDSs (direct digital synthesis) replaced the traditional frequency synthesis to generate the impulse signal and the clock of the detection phase signals. Secondly, the multi-slope A/D conversion was replaced by the true root-mean-square (RMS) conversion for dividing vectors. Because of the similar drivers for dual-DDSs, the design of software is easier than the traditional analyzer, and without the multi-integral, the speed of measurement is higher than that of the traditional analyzer.
机译:研究了传统的低频阻抗分析技术的两种改进。 首先,双DDSS(直接数字合成)替换传统频率合成以产生脉冲信号和检测相位信号的时钟。 其次,将多斜率A / D转换由真正的根均线(RMS)转换代替用于除去载体。 由于双DDS的类似驱动程序,软件的设计比传统的分析仪更容易,而没有多积分,测量速度高于传统分析仪的速度。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号