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INITIATION OF FATIGUE DAMAGE IN ULTRA-FINE GRAINED THIN FILMS: SCHMID, TAYLOR OR HALL-PETCH?

机译:在超细颗粒薄膜中引发疲劳损伤:施密,泰勒或霍尔拼图?

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摘要

The evolution of fatigue damage in metallic films is usually described by several subsequent stages. First, the dislocation slip induces formation of slip steps and slip bands. Application of further cyclic mechanical load leads to formation of extrusion/intrusion couples and, finally, crack propagation. Although this general description of the fatigue damage development is well established and can be generally applied to different materials, surprisingly little is known about the very early stage of fatigue damage initiation especially for ultra-fine grained (UFG) and nanocrystalline thin films. From the point of view of classical plasticity theory, the plastic slip should occur first within most favorably oriented grains with the highest resolved shear stress that corresponds to the lowest Taylor factor or the highest Schmid factor. The core question which this presentation will try to address can be formulated as following: is it possible to predict where the fatigue damage will be initiated for a given UFG thin film with a given microstructure?
机译:金属膜中疲劳损伤的演变通常由几个后续阶段描述。首先,位错滑动诱导滑动步骤和滑动带的形成。进一步循环机械负荷的应用导致挤出/侵入耦合的形成,最后,裂纹繁殖。虽然这种疲劳损伤发展的一般描述是很好的,并且通常可以应用于不同的材料,但令人惊讶的是关于疲劳损伤引发的早期阶段,特别是对于超细颗粒(UFG)和纳米晶薄膜的早期阶段。从古典塑性理论的角度来看,塑料滑动应首先在最有利地取向的颗粒中,具有最高的分辨剪切应力,所述抗剪切应力对应于最低泰勒因子或最高的施密因子。此演示文稿将尝试解决的核心问题可以制定如下:是否可以预测具有给定微结构的给定UFG薄膜的疲劳损坏的位置?

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