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Microwave filter design for electromagnetic near field probe development

机译:电磁滤波器设计微波滤波器设计

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Electromagnetic near field measurement technologies [1] are not only for traditional EMI detection, but also getting into PI/SI/ESD applications in recent years. Especially, SiP technology was used in many high integrity products successfully. In order to observe inside the circuits in package level, the H-probe design [2] would be smaller for higher resolution. Golden samples design is present to provide controllable H field between different trace to trace spacing by fist-order 1/4 λ coupled line of microwave filter. The design changes the coupled line spacing (S= 1.5mm, 1.03mm, 0.56mm, 0.25mm, and 0.12mm) by adjusting the bandwidth (Δ=0.008, Δ=0.018, Δ=0.05, Δ=0.15, andΔ=0.6) for different operating bandwidths of 3GHz central frequency. In this method, the stable radiation H field could be collected by coupling characteristic, and probe measurement resolution would be verified accurately by different bandwidths design. We test the H-probe of EMI by using different line spacing, and observed whether H filed of EMI measurement [3] meet the simulation result by 3D EM full-wave solver.
机译:电磁近场测量技术[1]不仅用于传统的EMI检测,还近年来进入PI / SI / ESD应用。特别是,SIP技术成功地用于许多高完整性产品。为了在包装级别的电路内观察,H探针设计[2]对于更高分辨率来说将更小。在不同的迹线之间提供金色样品设计,以在不同的迹线之间提供可控的H场,以通过微波滤波器的拳头1/4λ耦合线跟踪间隔。通过调节带宽(Δ= 0.008,Δ= 0.018,Δ= 0.05,Δ= 0.15,改变耦合线间距(S = 1.5mm,1.03mm,0.5mm,0.25mm和0.12mm)改变耦合线间距(S = 1.5mm,1.03mm,0.25mm和0.12mm),= 0.6 )对于不同的3GHz中央频率的不同工作带宽。在该方法中,可以通过耦合特性收集稳定的辐射H场,并且通过不同的带宽设计将探测测量分辨率精确验证。我们通过使用不同的线间距来测试EMI的H-探测,并观察到EMI测量的H是否归档,通过3D EM全波解算器满足模拟结果。

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