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Simple and Highly Effective Purification of Metallurgical-Grade Silicon Through Metal-Assisted Chemical Leaching

机译:金属辅助化学浸出法提纯冶金级硅

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The present study proposed a simple and highly effective method for removal of impurities from large-sized particle metallurgical-grade silicon (MG-Si) powders based on metal-assisted chemical leaching (MACL). The various leaching approaches (MACL, HF + H_2O_2 leaching, HF leaching, HCl leaching) were investigated for leaching behaviors of the main impurities (Fe, Al, Ca, Ti, Ni, V, Mn, and Cu). The leaching results show that the order of impurities' removal efficiency, from highest to lowest, is MACL > HF - H_2O_2 leaching > HF leaching > HCl leaching. After MACL, The numerous micro-scale "channels" introduced by MACL which are beneficial for the removal of impurities, especially for the non-dissolving metal impurities, such as copper, calcium, and aluminum. It should be noted that the small amount of Cu mainly come from residual Cu nanoparticle and can be removed by simple acid washing.
机译:本研究提出了一种基于金属辅助化学浸出(MACL)去除大颗粒冶金级硅(MG-Si)粉末中杂质的简单而高效的方法。研究了不同的浸出方法(MACL、HF+H_2O_2浸出、HF浸出、HCl浸出)对主要杂质(Fe、Al、Ca、Ti、Ni、V、Mn和Cu)的浸出行为。浸出结果表明,杂质去除效率从高到低的顺序为MACL>HF-H2 OU 2浸出>HF浸出>HCl浸出。MACL之后,MACL引入了许多微尺度的“通道”,这些通道有利于去除杂质,尤其是铜、钙和铝等非溶解性金属杂质。需要注意的是,少量的铜主要来自残余的铜纳米颗粒,可以通过简单的酸洗去除。

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