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PID control loop performance assessment and diagnosis based on DEA-related MCDA

机译:PID控制回路性能评估与基于DEA相关MCDA的诊断

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Control loop performance assessment and diagnosis have been attracting more and more attention in the academia and industry. Both traditional performance assessment method and minimum variance method often require the process model and provide limited information, which is not particularly convenient for practical applications. Therefore, the method based on data envelopment analysis (DEA)-related multiple criteria decision analysis (MCDA) is developed for assessing and diagnosing PID control loop performance, which relies solely upon the collected process data during routine plant operation. The control loop performance is assessed and sorted by utilizing the self-evaluation DEA-related MCDA model. The operation priority of the control loop is ranked and determined by utilizing the cross-evaluation DEA-related MCDA model. The improving direction and quantitative space of control loop performance can be diagnosed by DEA-related MCDA model with slack variables and non-Archimedean infinitesimal ε. The correctness and effectiveness of the proposed method are confirmed and validated by simulation examples.
机译:控制回路性能评估和诊断在学术界和工业中一直在吸引越来越多的关注。传统的性能评估方法和最小方差方法既经常要求流程模型并提供有限的信息,这对实际应用并不是特别方便。因此,开发了基于数据包络分析(DEA)的方法的方法,用于评估和诊断PID控制回路性能,仅依赖于常规工厂操作期间收集的过程数据。通过利用自我评估DEA相关的MCDA模型来评估和排序控制回路性能。控制回路的操作优先级通过利用交叉评估DEA相关的MCDA模型来排序和确定。控制回路性能的提高方向和定量空间可以由DEA相关的MCDA模型诊断,具有松弛变量和非ARCHIMEDEAN Infinitsimalε。通过模拟实施例确认和验证了所提出的方法的正确性和有效性。

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