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PID control loop performance assessment and diagnosis based on DEA-related MCDA

机译:基于DEA相关MCDA的PID控制回路性能评估与诊断

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摘要

Control loop performance assessment and diagnosis have been attracting more and more attention in the academia and industry. Both traditional performance assessment method and minimum variance method often require the process model and provide limited information, which is not particularly convenient for practical applications. Therefore, the method based on data envelopment analysis (DEA)-related multiple criteria decision analysis (MCDA) is developed for assessing and diagnosing PID control loop performance, which relies solely upon the collected process data during routine plant operation. The control loop performance is assessed and sorted by utilizing the self-evaluation DEA-related MCDA model. The operation priority of the control loop is ranked and determined by utilizing the cross-evaluation DEA-related MCDA model. The improving direction and quantitative space of control loop performance can be diagnosed by DEA-related MCDA model with slack variables and non-Archimedean infinitesimal ε. The correctness and effectiveness of the proposed method are confirmed and validated by simulation examples.
机译:控制回路的性能评估和诊断已在学术界和工业界引起越来越多的关注。传统的性能评估方法和最小方差方法都经常需要过程模型并提供有限的信息,这对于实际应用而言并不是特别方便。因此,开发了基于数据包络分析(DEA)相关的多准则决策分析(MCDA)的方法来评估和诊断PID控制回路性能,该方法仅依赖于常规工厂运行期间收集的过程数据。通过使用自我评估DEA相关的MCDA模型来评估和分类控制回路性能。利用与交叉评估DEA相关的MCDA模型对控制回路的操作优先级进行排序和确定。可以通过DEA相关的MCDA模型(具有松弛变量和非Archimedean无穷小ε)来诊断控制回路性能的改善方向和定量空间。仿真实例验证了该方法的正确性和有效性。

著录项

  • 来源
  • 会议地点 Taipei(CN)
  • 作者单位

    College of Information Science and Technology, and the Engineering Research Center of Intelligent Process System Engineering, Ministry of Education, Beijing University of Chemical Technology, Beijing 100029, China;

    College of Information Science and Technology, and the Engineering Research Center of Intelligent Process System Engineering, Ministry of Education, Beijing University of Chemical Technology, Beijing 100029, China;

    College of Information Science and Technology, and the Engineering Research Center of Intelligent Process System Engineering, Ministry of Education, Beijing University of Chemical Technology, Beijing 100029, China;

    College of Information Science and Technology, and the Engineering Research Center of Intelligent Process System Engineering, Ministry of Education, Beijing University of Chemical Technology, Beijing 100029, China;

    College of Information Science and Technology, and the Engineering Research Center of Intelligent Process System Engineering, Ministry of Education, Beijing University of Chemical Technology, Beijing 100029, China;

    College of Information Science and Technology, and the Engineering Research Center of Intelligent Process System Engineering, Ministry of Education, Beijing University of Chemical Technology, Beijing 100029, China;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Process control; PD control; PI control; Benchmark testing; Decision analysis; Industries;

    机译:过程控制; PD控制; PI控制;基准测试;决策分析;行业;

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