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Zernike polynomials for mid-spatial frequency representation on optical surfaces

机译:光学表面上空间频率表示的Zernike多项式

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Mid-spatial frequency structure on freeform optical elements induces small-angle scatter and affects performance. Fabrication techniques involved in making freeform surfaces leave tooling marks on the surface due to the sub-aperture nature of the fabrication process. In recent years, there has been a growing need for specification and characterization of the mid-spatial frequencies for freeform surfaces. There are a range of methods to consider for representing the mid-spatial frequency content: the power spectral density (PSD), the structure function (SF) and a polynomial basis representation such as Zernike and Forbes Q-polynomials, as examples. In this paper, we investigate a Zernike polynomial representation for quantifying the mid-spatial frequency content in height maps. We will show fit coefficients of synthesized and real data sets to Zernike polynomials from low orders to very large orders. We also illustrate how this polynomial representation captures certain characteristics of the mid-spatial frequency error. The results are analyzed and compared with Forbes gradient orthogonal polynomials. Finally, limits of Zernike polynomials for representing mid-spatial frequency content of the surface are discussed.
机译:自由形式光学元件上的空间空间频率结构会引起小角度散射并影响性能。由于制造工艺的子孔径本质,在表面上涉及制造自由形状表面的制造技术。近年来,对自由形状表面的中间空间频率的规范和表征一直需要越来越大。有一系列方法需要考虑代表中间空间频率内容:功率谱密度(PSD),结构功能(SF)和多项式基础表示,例如Zernike和Forbes Q-多项式,作为示例。在本文中,我们研究了用于量化高度图中的中间空间频率内容的Zernike多项式表示。我们将向Zernike多项式显示合成的合成和实际数据集的拟合系数,从低订单到非常大的订单。我们还说明了该多项式表示如何捕获中间空间频率误差的某些特征。分析结果并与Forbes梯度正交多项式进行了分析。最后,讨论了用于表示表面中间空间频率含量的Zernike多项式的限制。

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