Development of simultaneous measurement system of junction temperatures in a LED module using pulsed-laser Raman scattering

摘要

Pulsed-laser Raman scattering technique was demonstrated to measure the junction temperatures in phosphor-less blue-LED module. Using a sheet-shaped laser as an incident beam, Raman spectra from several chips located on a straight line in the LED module were observed simultaneously. This technique was suggested to be a useful method for simultaneous measurement of the junction temperature of several chips located in a LED module.