Advanced Technology for Analytical Electron Microscopy by Using Aberration Corrected Transmission Electron

机译：使用像差校正透射电子通过使用像差校正透射电子显微镜的先进技术

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This manuscript is devoted to the presentation of the last High-End Transmission Electron Microscope (TEM) developed by JEOL: the JEM-ARM200F equipped with a Cold Field Emission Gun (CFEG) and Cs S/TEM correctors. Application examples will be presented.

机译：该稿件专门介绍由JEOL开发的最后一次高端透射电子显微镜（TEM）的呈现：配备冷场发射枪（CFEG）和CS / TEM校正的JEM-ARM200F。将呈现应用程序示例。

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《International Multidisciplinary Microscopy and Microanalysis Congress》|2015年|xix 262 p.|共5页
会议地点
作者
Guillaume Brunetti;
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原文格式 PDF
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中图分类 TH742-532;
关键词
Analytical; Electron; TEM;

机译：分析;电子;TEM;

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机译：通过像差校正透射电子显微镜/扫描透射电子显微镜和电子能量损失谱分析了对Si（001）上高k氧化镧薄膜的退火效应
2. Advances in Atomic Resolution In Situ Environmental Transmission Electron Microscopy and 1 angstrom Aberration Corrected In Situ Electron Microscopy [J] . Gai PL, Boyes ED Microscopy research and technique . 2009,第3期

机译：原子分辨率原位环境透射电子显微镜和1埃像差校正的原位电子显微镜的研究进展
3. Probing structures of nanomaterials using advanced electron microscopy methods, including aberration-corrected electron microscopy at the angstrom scale [J] . Gai P.L., Yoshida K., Shute C., Microscopy research and technique . 2011,第7期

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4. Advanced Technology for Analytical Electron Microscopy by Using Aberration Corrected Transmission Electron [C] . Guillaume Brunetti International Multidisciplinary Microscopy and Microanalysis Congress . 2015

机译：使用像差校正透射电子对分析电子显微镜的先进技术
5. Characterization of Electrochemical and Electronic Materials by in situ and Aberration-Corrected Scanning Transmission Electron Microscopy [D] . Holtz, Megan Elizabeth. 2017

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6. The Three-Dimensional Point Spread Function of Aberration-Corrected Scanning Transmission Electron Microscopy [O] . A.R. Lupini, N. de Jonge -1

机译：像差校正扫描透射电子显微镜的三维点扩散函数
7. Opportunities for Chromatic Aberration Corrected High-Resolution Transmission Electron Microscopy, Lorentz Microscopy and Electron Holography of Magnetic Minerals [O] . R. E. Dunin-borkowski, T. Kasama, R. J. Harrison, 2016

机译：色差的机会纠正了高分辨率透射电子显微镜，洛仑兹显微镜和磁性矿物的电子全息术

Advanced Technology for Analytical Electron Microscopy by Using Aberration Corrected Transmission Electron

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