首页> 外文会议>Conference on nanoengineering: Fabrication, properties, optics, and devices XII >Optical reflectivity as an inspection tool for metallic nanoparticles deposited randomly on a flat substrate
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Optical reflectivity as an inspection tool for metallic nanoparticles deposited randomly on a flat substrate

机译:光学反射率作为用于在平坦基板上随机沉积的金属纳米粒子的检查工具

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In this work we study the sensitivity and detection limits of optical reflectivity measurements to inspect the deposition of metallic nanoparticles on a flat surface. We use a theoretical model for the coherent reflectance of a disordered monolayer of particles to calculate the reflectivity of an air-glass interface with silver and gold nanoparticles deposited randomly on it as a function of the angle of incidence and wavelength of light. Assuming reasonable noise scenarios, we estimate the minimum detectable surface coverage fractions by the nanoparticles.
机译:在这项工作中,我们研究光学反射率测量的灵敏度和检测限制,以检查金属纳米颗粒在平坦表面上的沉积。我们使用理论模型来实现颗粒的混乱单层的相干反射率,以计算随机沉积的银和金纳米颗粒的反射率,作为光的发射角度和波长的函数。假设合理的噪声情景,我们估计纳米颗粒的最小可检测表面覆盖级分。

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