Study on Key Technology of High and Low Temperature Test System for Flight Control Unit

摘要

According to the engineering requirements of multiple sets of Flight control unit in high and low temperature test, a new test system based on CPCI bus with a signal switching and distribution unit is designed to increase test efficiency. This test system can switch serial test under programming control for multiple sets of flight control unit in a certain temperature gradient, saving the time of temperature change and staying warm, eliminating a lot of tedious manual operations. Theoretical analysis and engineering practice has proved that this test system significantly reduces the testing time in high and low temperature test up to thirty hours (five sets of DUT), namely that relative time efficiency is up to 75.4% (five sets of DUT). It also has some other advantages such as saving hardware resources and flexible use.