PHOTOEMISSION ELECTRON MICROSCOPY BRANCH OF SPECTROMICROSCOPY BEAMLINE OF THE IRANIAN LIGHT SOURCE FACILITY

摘要

Spectromicroscopy (SM) beamline is planned to be one of the day one beamlines of the Iranian Light Source Facility project (ILSF) to open high impact research investigations in the field of soft x-ray spectroscopy and microscopy for the Iranian and regional users. This beamline offers the possibility of performing photoelectron emission microscopy (PEEM) and scanning photoelectron microscopy (SPEM) to a large community of users including researchers working on nanomaterials, strongly correlated electron system, catalysis, etc, and related industries and companies. This beamline includes of two branches: PEEM and SPEM. This paper shortly reports first optical design of the PEEM branch by ray tracing calculations using XOP and SHADOW standard codes [6].