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NEW X-BAND DEFLECTING CAVITY DESIGN FOR ULTRA-SHORT BUNCH LENGTH MEASURE OF FEL AT SINAP

机译:新型X频段偏转腔设计,用于SINAP的FEL超短束度测量

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For the development of Free Electron Lasers (FEL) at SINAP, ultra-short bunch is the crucial requirement for excellent lasing performance. It's a big challenge for deflecting cavity to measure the length of ultra-short bunch, and higher deflecting gradient is required for higher measurement resolution. X-band travelling wave deflecting structure has features of higher deflecting voltage and compact structure, which is good performance at ultra-short bunch length measurement. In this paper, a new X-band deflecting structure has been designed, operated at HEM11-2π/3 mode. For suppressing the polarization of deflecting plane of the HEM11 mode, two symmetrical caves are added on the cavity wall to separate two polarized modes. More details of design and simulation results are presented in this paper.
机译:对于SINAP的自由电子激光器(FEL)的开发,超短束是优异激光性能的关键要求。偏转腔以测量超短束的长度是一个很大的挑战,更高的测量分辨率需要更高的偏转梯度。 X波段行波偏转结构具有较高的偏转电压和紧凑结构的特点,这在超短束度测量中具有良好的性能。在本文中,设计了一种新的X波段偏转结构,在HEM11-2π/ 3模式下操作。为了抑制HEM11模式的偏转平面的偏振,在腔壁上添加两个对称的腔,以分离两种偏振模式。本文提出了设计和仿真结果的更多细节。

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