TRANSVERSE BEAM PROFILE DIAGNOSTICS USING POINT SPREAD FUNCTION DOMINATED IMAGING WITH DEDICATED DE-FOCUSING

摘要

Transverse beam profile diagnostics in electron accelerators is usually based on direct imaging of a beam spot via visible radiation (transition or synchrotron radiation). In this case the fundamental resolution limit is determined by radiation diffraction in the optical system. A method to achieve resolutions beyond the diffraction limit is to perform point spread function (PSF) dominated imaging, i.e. the recorded image is dominated by the resolution function of a point source (single electron), and with knowledge of the PSF the true image (beam spot) can be reconstructed. To overcome the limited dynamic range of PSF dominated imaging, a dedicated de-focusing of the optical system can be introduced. In order to verify the applicability of this method, a proof-of-principle experiment has been performed at the Mainz Microtron MAMI (University of Mainz, Germany) using optical transition radiation. Status and results of this experiment are presented.