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Growth and Characterisation of Nanocrystalline ZnO Thin Films by Dip Coating Technique

机译:浸涂技术纳米晶ZnO薄膜的生长与表征

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Nanocrystalline zinc oxide (ZnO) thin films have been obtained by the sol gel process. A stable and homogeneous solution was prepared by dissolving zinc acetate dehydrate as a starting material in a solution of 2-methoxyethanol and monoethanolamine (MEA). The molar concentration of zinc acetate was fixed at 0.6 mol/L while the molar ratio of MEA to zinc acetate was kept at 1:1. The films were deposited by various deposition speeds by dip-coating on glass substrates, and subsequently transformed into nanocrystalline pure ZnO films after a thermal treatment. Various deposition speeds were selected as the parameter to optimize the thin films quality. The structural and optical properties of the ZnO films were studied by X-ray diffraction (XRD), UV-Vis-NIR spectroscopy, respectively. The electrical properties of the ZnO thin films were characterised by dc 2 probing system and power supply (Advantest R6243). It was found that the deposition speed affects the resultant properties of ZnO thin films.
机译:通过溶胶凝胶法得到纳米晶锌(ZnO)薄膜。通过将乙酸锌脱水作为原料中的2-甲氧基乙醇和单乙醇胺(MEA)溶解稳定和均匀的溶液。醋酸锌的摩尔浓度固定在0.6mol / L,而MEA与乙酸锌的摩尔比保持在1:1。通过在玻璃基板上浸涂,通过各种沉积速度沉积薄膜,然后在热处理后转化成纳米晶纯ZnO膜。选择各种沉积速度作为优化薄膜质量的参数。通过X射线衍射(XRD),UV-Vis-Nir光谱法研究了ZnO膜的结构和光学性质。通过DC 2探测系统和电源(优雅R6243)的特征在于ZnO薄膜的电性能。发现沉积速度影响ZnO薄膜的所得性质。

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