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Thin Surface Films Over Copper-Nickel Alloy: Corrosion Behavior in Neutral and Acidic Medium in Presence of Chloride Ions

机译:铜镍合金的薄表面薄膜:在氯离子存在下中性和酸性介质中的腐蚀行为

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Oxide films were grown over 90Cu-10Ni alloy using electrochemical polarization. The structure of the films was determined using a variety of surface techniques. Polarization curves were recorded for the alloy in different electrolytes of chloride, sulfate and the corresponding mixtures. It was ascertained that a protective layer consisting mainly of a thin, strongly adherent inner barrier Cu_2O-layer that is followed by a porous and thick outer Cu(II) hydroxide/oxide-layer is formed. Nickel affects the barrier properties of the surface film through a segregation of Ni from the alloy into the Cu_2O layer. The composition of the film formed over 90Cu-10Ni alloy was determined at different polarization times using FE-SEM/EDAX, XPS, ICP-ES, and electrochemical measurements. The ratio of Cu:Ni is maintained in the film composition after few seconds from the inset of polarization in chloride containing electrolytes. Ni-content in the film decreases and then increases after 30 and 60 minutes of the inset of polarization, respectively. In sodium sulfate and sulfuric acid solutions, the Cu:Ni ratio in the film is respected throughout the polarization times.
机译:使用电化学偏振在90℃-10NI合金中生长氧化物膜。使用各种表面技术测定薄膜的结构。在不同电解质的氯化物,硫酸盐和相应的混合物中记录偏振曲线。确定了一种主要由薄,强粘附的内屏障Cu_2O层组成的保护层,其后是多孔且厚的外Cu(II)氢氧/氧化物层。镍通过从合金中的Ni的偏析从合金中的偏析影响表面膜的阻隔性能。使用Fe-SEM / edax,XPS,ICP-ES和电化学测量在不同的偏振次数下测定超过90℃-10NI合金的膜的组成。在含有电解质中的氯化物中的偏振的插图之外几秒钟后,Cu:Ni的比例在薄膜组合物中保持在膜组合物中。膜中的Ni含量降低,然后分别在偏振的插入的30和60分钟后增加。在硫酸钠和硫酸溶液中,在整个偏振时间内互斥膜中的Cu:Ni比。

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