首页> 外文会议>Counterfeit Electronic Parts and Electronic Supply Chain West Symposium >AS6171 – Method I - Techniques for Suspect/Fraudulent /Counterfeit EEE Part Detection by External Visual Inspection, Remarking and Resurfacing, Lead Finish, and Surface Analysis Test Methods - (PPT)
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AS6171 – Method I - Techniques for Suspect/Fraudulent /Counterfeit EEE Part Detection by External Visual Inspection, Remarking and Resurfacing, Lead Finish, and Surface Analysis Test Methods - (PPT)

机译:AS6171 - 方法I - 嫌疑人/欺诈/假冒EEE部分通过外部目视检查,备注和重新铺设,铅饰面和表面分析试验方法 - (PPT)的技术

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摘要

Method I of AS6171 includes External Visual Inspection, Remarking and Resurfacing, Lead Finish, and Surface Analysis Test Methods; This method is the first in the sequence of counterfeit detection test methods; High emphasis on personnel training due to the subjective nature of visual inspection; SEM is only required for components which are deemed to have high risk.
机译:AS6171的方法I包括外部目视检查,备注和重新铺设,铅饰面和表面分析试验方法;该方法是伪造检测方法序列中的第一个;由于目视检查的主观性质,高重点是人员培训; SEM仅需要被视为具有高风险的组件。

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