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Electrically pumped Er-doped light emitting slot waveguides for on-chip optical routing at 1.54 μm

机译:电动泵送的ER掺杂发光槽波导,用于在1.54μm的片上光学布线

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Optoelectronic properties of Er~(3+)-doped slot waveguides electrically driven are presented. The active waveguides have been coupled to a Si photonic circuit for the on-chip distribution of the electroluminescence (EL) signal at 1.54 urn. The Si photonic circuit was composed by an adiabatic taper, a bus waveguide and a grating coupler for vertical light extraction. The EL intensity at 1.54 μm was detected and successfully guided throughout the Si photonic circuit. Different waveguide lengths were studied, finding no dependence between the waveguide length and the EL signal due to the high propagation losses measured. In addition, carrier injection losses have been observed and quantified by means of time-resolved measurements, obtaining variable optical attenuation of the probe signal as a function of the applied voltage in the waveguide electrodes. An electro-optical modulator could be envisaged if taking advantage of the carrier recombination time, as it is much faster than the Er emission lifetime.
机译:呈现了ER〜(3 +)掺杂槽波导的光电性。活性波导已经耦合到Si光子电路,用于在1.54 URN处的电致发光(EL)信号的片上分布。 Si光子电路由绝热锥形,总线波导和用于垂直光提取的光栅耦合器组成。在整个Si光子电路中检测并成功引导EL强度为1.54μm。研究了不同的波导长度,由于测量的高传播损耗,在波导长度和EL信号之间找不到依赖性。另外,通过时间分辨测量观察和量化载体注射损耗,从而获得探头信号的可变光学衰减作为波导电极中的施加电压的函数。如果利用载体重组时间,可以设想电光调制器,因为它比ER发射寿命快得多。

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