首页> 外文会议>Nanotech,Microtech,Biotech,Cleantech Proceedings >Use of Single Particle Inductively Coupled Plasma Mass Spectrometry to Characterize a New Silver Nanoparticle Reference Material
【24h】

Use of Single Particle Inductively Coupled Plasma Mass Spectrometry to Characterize a New Silver Nanoparticle Reference Material

机译:使用单颗粒电感耦合等离子体质谱法表征新的银纳米颗粒参考物质

获取原文

摘要

In this study we use inductively coupled plasma mass spectrometry operated in single particle mode (spICP-MS) to simultaneously characterize the size distribution and dissolved silver fraction of a new silver nanoparticle (AgNP) candidate reference material, RM 8017, composed of polyvinylpyrrolidone (PVP)-stabilized 75 nm AgNPs (nominal size). We show the potential for bias in spICP-MS measurement of AgNPs if the time lapse between preparation of the dilute suspension in water and measurement is not minimized. We demonstrate that the particle size distributions measured by spICP-MS compare well with transmission electron microscopy (TEM), atomic force microscopy (AFM), and ultra-small angle X-ray scattering (USAXS) measurements. Finally, data on the stability of reconstituted RM 8017 stored at 4 °C shows minimal degradation of the AgNPs over the period of 90 days. This study shows the potential of spICP-MS as a tool to characterize the basic parameters of nanoparticle suspensions including size, size distribution, and ionic content.
机译:在该研究中,我们使用单颗粒模式(SPICP-MS)操作的电感耦合等离子体质谱法同时表征新的银纳米粒子(AGNP)候选参考材料RM 8017的尺寸分布和溶解的银级分,由聚乙烯吡咯烷酮组成(PVP )-Ablized 75nm Agnps(标称尺寸)。如果在水和测量中稀释悬浮液的制备之间的时间流逝,我们展示了AGNPS的SPICP-MS测量中的偏差潜力。我们证明,SPICP-MS测量的粒度分布与透射电子显微镜(TEM),原子力显微镜(AFM)和超小角X射线散射(USAXS)测量相比。最后,关于储存在4°C的重构RM 8017的稳定性数据显示了在90天的时间内极小的agnps降解。该研究表明SPICP-MS作为表征纳米粒子悬浮液的基本参数的工具的潜力,包括尺寸,尺寸分布和离子含量。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号